AWG G3 PAD FOR PS3 Spezifikationen PDF herunterladen (Seite 260)

7 Analog Modules Synchronization

260 System Reference, January 2001

Master Trigger Function

When performing tests using multiple channels of high

speed analog modules simultaneously, it is important to

remove uncertainty between channels as much as

possible.

When you use different master clock sources for digital

channels and analog modules, uncertainty happens not

only between the digital channels as the trigger source and

analog modules, but also between analog modules.

However, for High Speed AWGs and Dual High Speed

Samplers, you can remove the uncertainty between

analog modules by using the Master Trigger Function.

The master trigger function is available among the same

kind of high speed AWGs or among dual high speed

samplers. You cannot use the master trigger function

among high speed AWGs and dual high speed samplers.

The master trigger function can achieve the skew between

modules within ±1 ns (typical) for high speed AWGs, and

±1 ns (typical) for dual high speed samplers.

The master trigger function enables an analog module

(high speed AWG or dual high speed sampler) to trigger

other identical kinds of modules installed in a card cage of

the testhead. For this function, all high speed AWGs or all

dual high speed samplers installed in a card cage of the

testhead are connected with the “Master-Slave” internal

connection. This connection is a closed-loop in slot

number order. The following figure shows the “

Master-

Slave

” internal connection in a card cage of the testhead.

If multiple high speed AWGs or dual high speed samplers

are installed in any card cage of the testhead, they are

connected with the “Master-Slave” internal connection

cables at the time of shipment from the factory.

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AWG G3 PAD FOR PS3 Spezifikationen Seite 260